Silicon ( Si )

Reference: NIST Structural Ceramics Database

Note: About Property Data Summaries.

Note: Abbreviations and Other Notes

Note: Other Materials

Material Summary:
                      [Ref. 1]              [Ref. 2]
Manufacturer........: Texas Instruments     Unknown
Material Designation: silicon               silicon
Material Form.......: Single Crystal        Single Crystal
Composition.........: Si                    Si
Processing..........: 



References:
   [1] G. R. Anstis, P. Chantikul, B. R. Lawn, and D. B. Marshall, "A Critical Evaluation of Indentation
       Techniques for Measuring Fracture Toughness: I, Direct Crack Measurements"
       Journal of the American Ceramic Society, Vol. 64, No. 9,  pp. 533-538 (1981)
   [2] C. St. John, "The Brittle-To-Ductile Transition in Pre-Cleaved Silicon"
       Philosophical Magazine, Vol. 32, pp. 1194-1212, (1975). 



Property Table:
Temperature = 23 °C

Grain    Porosity    Fracture      Fracture   Measurement  Measurement  Comments
Size                 Toughness     Energy     Method       Environment
[µm]       [%]       [MPa·m1/2]     [J/m2] 
------   --------   ------------   ---------  -----------  -----------  --------------------------------
                        0.79                     ICS           air       Ref. 1; E = 168 GPa
                        0.95                     IS
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                                     2.7         TDCB          air       Ref. 2; The crystal was
                                                                                 boron doped (P type)
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