Dr. Peter Schenck

Current Research Interests

• Thin film deposition by Pulsed laser deposition (PLD)
  and characterization by Spectroscopic Reflectometry
• Computer graphics and image analysis
  See: Ceramics Division Gallery
• Combinatorial methods for thin films: library fabrication and characterization
• Laboratory automation for rapid throughput
• High speed temperature measurements
• Combinatorial library presentation

Prior Research Activities

• Plasma monitoring and control
• Laser design
• Optogalvanic spectroscopy
• Atomic and molecular emission, absorption, and laser spectroscopy

Biographical Information

• Education
• Ph.D., State University of New York at Stoney Brook, Physics, 1973
• M.A., State University of New York at Stoney Brook, Physics, 1968
• B.S., Rensselear Polytechnic Institute, Physics, 1967
• Employment History
• 10/96-present: NIST, Ceramics Division, Physicist
  Ceramic Thin Film Measurements and Standards
• 10/90-9/96: NIST, Metallurgy Division, Physicist
• 10/75-9/90: NBS/NIST, Inorganic Chemistry/Ceramics Division, Physicist
• 2/75-9/76: NBS, Quantum Metrology Group, Physicist
• 10/73-2/75: Naval Research Lab, Chemistry Division, NRC Postdoctoral Associate
• 4/69-6/71: Grumman Corporation, Power, Optics and Displays Division, Optical Engineer

Selected Publications

• Low Cost Nitrogen Laser for Dye Laser Pumping, P.K. Schenck and H. Metcalf, Applied Optics, 12, 183 (1973)
• Time-Resolved Fluorescence from Ba and Ca Excited by a Pulsed Tunable Dye Laser, P. K. Schenck, R. C. Hilborn, and H. Metcalf , Phys. Rev. Lett., 31, 189 (1973)
• Galvanic Detection of Optical Absorptions in a Gas Discharge, R. Green, R. Keller, G. Luther, P. K. Schenck, and J. Travis ,App. Phys. Lett., 29, 727 (1976)
• Opto-Galvanic Spectroscopy, David S. King and Peter K. Schenck, Laser Focus, March 1978
• Optogalvanic Spectroscopy - Application to Combustion Systems, P. K. Schenck and J. W. Hastie, Opt. Eng., 20, 522 (1981)
• Computer Graphics for Ceramic Phase Diagrams, P. K. Schenck and J. R. Dennis, Computer Handling and Dissemination of Data, P. S. Glasser ed., 184-188, Elsevier Pub. (1987).
• PC-Access to Ceramic Phase Diagrams, P. K. Schenck and J. R. Dennis, Computerization and Networking of Materials Data Bases, Glazman and Rumble eds., 292- 303, ASTM (1989)
• In-situ Analysis of Laser-Induced Vapor Plumes, P. K. Schenck, D.W. Bonnell and J. W. Hastie, High Temp. Science, 27, 483 (1990)
• Measurements and Analyses of Temporally and Spatially Resolved Spectra of Graphite Plasma Plume Induced by Laser, Zhao Jianrong, Peter K. Schenck, and Li Chunjin, Acta Mechanica Sinica, 26, 348 (1994)
• Gas Dynamics and Chemistry in the Pulsed Laser Deposition of Oxide Dielectric Thin Films, J.W. Hastie, D.W. Bonnell, A.J. Paul, and P.K. Schenck, MRS Symp. Proc., 334, 305 (1994)
• In Situ Monitoring and Model Simulation of BaTiO₃ Pulsed Laser Thin Film Deposition, A. J. Paul, P.K. Schenck, D.W. Bonnell, and J.W. Hastie, Film Synthesis and Growth using Energetic Beams (MRS Symp. Proc. 388), MRS, Pittsburgh, PA, 1995
• In Situ Monitoring in the Pulsed Laser Deposition of Ferroelectric Thin films, Peter K. Schenck, Mark D. Vaudin, Byeong W. Lee, David W. Bonnell, John W. Hastie, and Albert J. Paul, Ferroelectric Thin Films IV (MRS Symp. Proc. 361), MRS, Pittsburgh, PA, 1995
• High Temperature Chemistry in Laser Plumes, J. W. Hastie, D. W. Bonnell, A. J. Paul, J. Yeheskel and P. K. Schenck, High Temperature Science and Materials, 33,135 (1995)
• Imaging and Modeling of Pulsed Laser Thin Film Deposition Plumes, Peter K. Schenck, John W. Hastie, Albert J. Paul, and David W. Bonnell, Optical Engineering, 35, 3199 (1996)
• "In Situ Monitoring by Mass Spectrometry of Laser Ablation Plumes Used in Thin Film Deposition," J.W. Hastie, A.J. Paul, D.W. Bonnell, P.K. Schenck, High Temperature Synthesis of Materials, ACS Symposium Series 681, Eds. M. Serio, D. Gruen & R. Malhotra (ACS, Washington, DC, 1998).
• High Temperature Chemistry of the Pulsed Laser Thin Film Deposition Process, J.W. Hastie, A.J. Paul, D.W. Bonnell, P.K. Schenck, IXth IUPAC Intl. Conference on High Temperature Materials Chemistry, Ed. K.A. Spear, (Electrochem. Soc, Pennington, N.J., 1997)
• Particulate Reduction in the Pulsed Laser Deposition of BaTiO₃ Thin Films, P.K. Schenck, M.D. Vaudin, D.W. Bonnell, J.W. Hastie, and A.J. Paul, Appl. Surf. Sci., 127-129 (1-4) 655-661, (1998)
• Monte Carlo Simulations of Plume Evolution From Laser Ablation of Graphite and Barium Titanate, Amit Ranjan, Sanjeev Sinha, P.K. Ghosh, J.W. Hastie, D.W. Bonnell, A.J. Paul, and P.K. Schenck, Chem. Phys. Lett., 277, 545-550, 1997.
• Monte Carlo Studies of Evolution of Products from Laser-Induced Carbon, Alumina, and Barium Titanate Plasmas, P.K. Ghosh, A. Ranjan, S. Sinha, J.W. Hastie, D.W. Bonnell, A.J.Paul, and P.K. Schenck, 13th Intl. Symp. Plasma Chem. (Beijing, China, August, 1997).
• The Effect of Gas-Surface Interactions on Laser-Generated BaTiO₃ Plumes during PLD, A.J. Paul, P.K. Schenck, D.W. Bonnell, J.W. Hastie, M.D. Vaudin, Advances in Laser Ablation of Materials, MRS Symp. Proc. 526, Eds. R.K. Singh, D.H. Lowndes, D.B. Chrisey, J. Narayan, T. Kawai, E. Fogarassy, (MRS, Pittsburgh, PA, 1998)
• Spectroscopy of Thermal Spray Plumes, P.K. Schenck, D.W. Bonnell, J.W. Hastie, in NISTIR 6460: Thermal Spray Coatings Workshop: Sensors, Modeling and Control Strategies, Eds. F.S. Biancaniello and S.D. Ridder, NIST, Gaithersburg, MD, Nov. 1999
• Manufacture and Electron Microprobe Characterization of Barium-Strontium-Titanate (BST) Films, R. B. Marinenko, J. Armstrong, D. L. Kaiser, J. J. Ritter, P. K. Schenck, C. Bouldin, J. E. Blendell, and I. Levin, Proceedings of the 2000 International Conference on Characterization and Metrology of ULSI